Patent · US Active

Apparatus for dual speed spin chuck

US10022745B2 · kind B2 · utility

0Cited by
16References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 29, 2014
Grant dateJul 17, 2018
Priority date
Expiry dateJul 29, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/6838
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A spin chuck according to the present invention is provided and is configured to eliminate the wrap of chemical over the wafer edge. The dual speed wafer spin chuck apparatus acts to prevent liquids from affecting the backside of a wafer during processing. An outer ring is placed around the wafer with a narrow gap between the two such that drops of liquid on the surface of the wafer will touch the outer ring as they move to the outermost edge of the wafer. By spinning this outer ring at high speed, centrifugal force causes these drops to be pulled off of the wafer and flung radially outward, thus preventing the liquid from affecting the backside of the wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.