Patent · US Active

Time temperature monitoring system

US10032683B2 · kind B2 · utility

9Cited by
8References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 16, 2015
Grant dateJul 24, 2018
Priority date
Expiry dateApr 19, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01K3/10
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A time temperature monitoring system and method for use with a microchip or similar structure. A disclosed system includes: a substrate having an active region; a dopant source located proximate the active region; an activation system for activating a diffusion of the dopant source into the active region; and a set of spatially distributed electrodes embedded in the active region of the substrate, wherein the electrodes are configured to detect the diffusion in the active region at varying distances from the dopant source to provide time temperature information.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.