Patent · US Active

Implantation using solid aluminum iodide (AlI3) for producing atomic aluminum ions and in situ cleaning of aluminum iodide and associated by-products

US10087520B2 · kind B2 · utility

4Cited by
1References
20Claims
0Family size

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Key dates

Filing dateJun 20, 2017
Grant dateOct 2, 2018
Priority date
Expiry dateJun 20, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/31705
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An ion implantation system is provided having an ion source configured to form an ion beam from aluminum iodide. A beamline assembly selectively transports the ion beam to an end station configured to accept the ion beam for implantation of aluminum ions into a workpiece. The ion source has a solid-state material source having aluminum iodide in a solid form. A solid source vaporizer vaporizes the aluminum iodide, defining gaseous aluminum iodide. An arc chamber forms a plasma from the gaseous aluminum iodide, where arc current from a power supply is configured to dissociate aluminum ions from the aluminum iodide. One or more extraction electrodes extract the ion beam from the arc chamber. A water vapor source further introduces water to react residual aluminum iodide to form hydroiodic acid, where the residual aluminum iodide and hydroiodic acid is evacuated from the system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.