Microscope and microscopy method

US10095017B2 · kind B2 · utility

Assignee

• Carl Zeiss Microscopy GmbH · DE

Inventors

• Tiemo Anhut · Jena, DE
• Thomas Kalkbrenner · Jena, DE
• Ralf Netz · Jena, DE

Key dates

• Filing date: May 7, 2013
• Grant date: Oct 9, 2018
• Expiry date: May 7, 2033

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B26/06
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

A microscope, preferably a laser scanning microscope, with at least one illuminating beam, which in a partial area along the cross-section thereof, is phase-modulated with a modulation frequency. A microscope objective is provided for focusing the illumination beam onto a sample. The microscope further has a detection beam path and at least one demodulation means, wherein a pulsed illumination beam is present. In the illumination beam path upstream of the microscope objective, a first polarization beam splitter is provided, which generates at least first and second partial beam paths that have differing, preferably adjustable, optical paths. A combination element, such as a second pole splitter, for rejoining the partial beams is provided. In one partial beam path, a phase element is provided, which has at least two areas having differing phase interferences.