Patent · US Active

Methods for wet metal seed deposition for bottom up gapfill of features

US10103056B2 · kind B2 · utility

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5References
27Claims
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Key dates

Filing dateMar 8, 2017
Grant dateOct 16, 2018
Priority date
Expiry dateMar 8, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76879
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of depositing a metal seed for performing bottom-up gapfill of features of a substrate includes providing a substrate including a plurality of features; flowing a dilute metal precursor solution into the features, wherein the dilute metal precursor solution includes a metal precursor and a dilution liquid; evaporating the dilution liquid to locate the metal precursor at bottoms of the plurality of features; exposing the substrate to a plasma treatment to reduce the metal precursor to at least one of a metal or a metal alloy and to form a seed layer; performing a heat treatment on the substrate; and using a selective gapfill process to fill the features with a transition metal in contact with the seed layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.