Semiconductor package having a variable redistribution layer thickness
US10115668B2 · kind B2 · utility
3Cited by
1References
10Claims
0Family size
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Key dates
| Filing date | Dec 15, 2015 |
| Grant date | Oct 30, 2018 |
| Priority date | — |
| Expiry date | May 1, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/14
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
Semiconductor packages having variable redistribution layer thicknesses are described. In an example, a semiconductor package includes a redistribution layer on a dielectric layer, and the redistribution layer includes first conductive traces having a first thickness and second conductive traces having a second thickness. The first thickness may be different than the second thickness, e.g., the first thickness may be less than the second thickness.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.