Patent · US Active

Error control in memory storage systems

US10146617B2 · kind B2 · utility

0Cited by
7References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 13, 2015
Grant dateDec 4, 2018
Priority date
Expiry dateOct 3, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03M13/6325
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A method includes calculating a first syndrome of a codeword read from a memory location under a first set of conditions and calculating a second syndrome of the codeword read from the memory location under a second set of conditions. The method also includes analyzing the first and second syndromes and applying one of the first and second syndromes to the codeword to find the codeword having a minimum number of errors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.