Patent · US Active

Method for forming contact plug layout

US10169521B2 · kind B2 · utility

2Cited by
2References
19Claims
0Family size

Assignees

Inventors

Key dates

Filing dateApr 4, 2017
Grant dateJan 1, 2019
Priority date
Expiry dateMay 18, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D89/10
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for forming a contact plug layout include following steps. (a) Receiving a plurality of active region patterns and a plurality of buried gate patterns that are parallel with each other, and each active region pattern overlaps two buried gate patterns to form two overlapping regions and one contact plug region in between the two overlapping regions in each active region pattern; and (b) forming a contact plug pattern in each contact plug region, the contact plug pattern respectively includes a parallelogram, and an included angle of the parallelogram is not equal to 90°. The contact plug pattern in each active region pattern partially overlaps the two buried gate pattern, respectively. The step (a) to the step (b) are implemented using a computer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.