Insitu tool health and recipe quality monitoring on a CDSEM
US10185312B2 · kind B2 · utility
1Cited by
4References
12Claims
0Family size
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Key dates
| Filing date | Jan 31, 2017 |
| Grant date | Jan 22, 2019 |
| Priority date | — |
| Expiry date | Apr 9, 2037 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/80
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
Systems, methods, and computer program products for monitoring the tool health of on a critical dimension scanning electron microscope (CDSEM) and recipe quality on a CDSEM. Run-time data from a critical dimension scanning electron microscope is received at a computer. The computer converts the run-time data to time-sequenced data, and analyzes the time-sequenced data to detect an operational abnormality associated with the CDSEM.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.