Patent · US Active

Insitu tool health and recipe quality monitoring on a CDSEM

US10185312B2 · kind B2 · utility

1Cited by
4References
12Claims
0Family size

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Key dates

Filing dateJan 31, 2017
Grant dateJan 22, 2019
Priority date
Expiry dateApr 9, 2037

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P90/80
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

Systems, methods, and computer program products for monitoring the tool health of on a critical dimension scanning electron microscope (CDSEM) and recipe quality on a CDSEM. Run-time data from a critical dimension scanning electron microscope is received at a computer. The computer converts the run-time data to time-sequenced data, and analyzes the time-sequenced data to detect an operational abnormality associated with the CDSEM.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.