System and method for determining clutter in an acquired image
US10192283B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2014 |
| Grant date | Jan 29, 2019 |
| Priority date | — |
| Expiry date | Dec 22, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/01
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
This invention provides a system and method for determining the level of clutter in an image in a manner that is rapid, and that allows a scoring process to quickly determine whether an image is above or below an acceptable level of clutter—for example to determine if the underlying imaged runtime object surface is defective without need to perform a more in-depth analysis of the features of the image. The system and method employs clutter test points that are associated with regions on the image that should contain a low gradient magnitude, indicative of emptiness. This enables the runtime image to be analyzed quickly by mapping trained clutter test points at locations in the coordinate space in which lack of emptiness indicates clutter, and if detected, can rapidly indicate differences and/or defects that allow for the subject of the image to be accepted or rejected without further image analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.