David J. Michael
99Patents
27h-index
73Co-inventors
91Inventor score
Filing activity: Jun 2, 1982 → Aug 11, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5768443A | Method for coordinating multiple fields of view in multi-camera | Physics | 277 | Expired |
| US5640200A | Golden template comparison using efficient image registration | Physics | 178 | Expired |
| US6173070A | Machine vision method using search models to find features in three dimensional images | Physics | 123 | Expired |
| US5825913A | System for finding the orientation of a wafer | Electricity | 116 | Expired |
| US5640199A | Automated optical inspection apparatus | Electricity | 105 | Expired |
| US5548326A | Efficient image registration | Physics | 102 | Expired |
| US6137893A | Machine vision calibration targets and methods of determining their location and orientation in an image | Physics | 101 | Expired |
| US5960125A | Nonfeedback-based machine vision method for determining a calibration relationship between a camera and a moveable object | Physics | 95 | Expired |
| US5550763A | Using cone shaped search models to locate ball bonds on wire bonded devices | Electricity | 86 | Expired |
| US5912984A | Method and apparatus for in-line solder paste inspection | Electricity | 79 | Expired |
| US5581632A | Method and apparatus for ball bond inspection system | Physics | 79 | Expired |
| US5987172A | Edge peak contour tracker | Physics | 76 | Expired |
| US6539107B1 | Machine vision method using search models to find features in three-dimensional images | Physics | 70 | Expired |
| US8111904B2 | Methods and apparatus for practical 3D vision system | Physics | 58 | Active |
| US5978521A | Machine vision methods using feedback to determine calibration locations of multiple cameras that image a common object | Physics | 57 | Expired |
| US6421458B2 | Automated inspection of objects undergoing general affine transformation | Physics | 56 | Expired |
| US5825483A | Multiple field of view calibration plate having a reqular array of features for use in semiconductor manufacturing | Physics | 53 | Expired |
| US6240218A | Apparatus and method for determining the location and orientation of a reference feature in an image | Physics | 46 | Expired |
| US5943441A | Edge contour tracking from a first edge point | Physics | 42 | Expired |
| US5757956A | Template rotating method for locating bond pads in an image | Physics | 40 | Expired |
| US5872870A | Machine vision methods for identifying extrema of objects in rotated reference frames | Physics | 40 | Expired |
| US6035066A | Boundary tracking method and apparatus to find leads | Electricity | 37 | Expired |
| US5901241A | Labeled projection of digital images | Physics | 36 | Expired |
| US8126260B2 | System and method for locating a three-dimensional object using machine vision | Physics | 33 | Active |
| US5978081A | Multiple field of view calibration plate for use in semiconductor manufacturing | Physics | 31 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.