Circuit defect diagnosis based on sink cell fault models
US10234502B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 9, 2017 |
| Grant date | Mar 19, 2019 |
| Priority date | — |
| Expiry date | May 30, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318342
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Various aspects of the disclosed technology relate to circuit defect diagnosis based on sink cell fault models. Defect candidates are determined based on path-tracing from failing bits into the circuit design. Based on the defect candidates and one or more conventional fault models, failing test pattern simulations are performed to determine initial defect suspects. Initial defective sink cell suspects are then determined by comparing driving strengths for fan-out cells of the initial defect suspects with driving strengths for corresponding driver cells. Defective sink cell suspects may be identified in the initial defective sink cell suspects based on fault effect propagations and passing test pattern simulations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.