Manish Sharma
236Patents
26h-index
218Co-inventors
93Inventor score
Filing activity: Aug 24, 1993 → Jan 29, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7194413B2 | Method of providing localized information from a single global transformation source | Physics | 165 | Expired |
| US6483734B1 | Memory device having memory cells capable of four states | Physics | 139 | Expired |
| US7041598B2 | Directional ion etching process for patterning self-aligned via contacts | Electricity | 138 | Expired |
| US5717795A | Optical wavelength division multiplexed network system | Electricity | 110 | Expired |
| US6750491B2 | Magnetic memory device having soft reference layer | Physics | 109 | Expired |
| US7002197B2 | Cross point resistive memory array | Electricity | 92 | Expired |
| US6404674B1 | Cladded read-write conductor for a pinned-on-the-fly soft reference layer | Electricity | 60 | Expired |
| US6837625B2 | Flexible seal to reduce optical component contamination | Physics | 56 | Expired |
| US7324095B2 | Pressure-sensitive input device for data processing systems | Physics | 51 | Active |
| US6940747B1 | Magnetic memory device | Electricity | 49 | Expired |
| US6473337B1 | Memory device having memory cells with magnetic tunnel junction and tunnel junction in series | Physics | 45 | Expired |
| US7054119B2 | Coupled ferromagnetic systems having modified interfaces | Emerging Cross-Sectional Technologies | 44 | Expired |
| US6577529B1 | Multi-bit magnetic memory device | Physics | 43 | Expired |
| US6470120B2 | Method and apparatus for aligning fiber optics with optical elements | Physics | 39 | Expired |
| US6936479B2 | Method of making toroidal MRAM cells | Physics | 39 | Expired |
| US7386333B1 | Test subject monitoring device | Human Necessities | 37 | Active |
| US7397392B2 | Method for remote monitoring equipment for an agricultural machine | Physics | 37 | Active |
| US6081355A | Multi-wavelength light source | Electricity | 35 | Expired |
| US6850433B2 | Magnetic memory device and method | Electricity | 33 | Expired |
| US6708139B2 | Method and apparatus for measuring the quality of delay test patterns | Physics | 31 | Expired |
| US7512508B2 | Determining and analyzing integrated circuit yield and quality | Physics | 31 | Expired |
| US6593608B1 | Magneto resistive storage device having double tunnel junction | Electricity | 30 | Expired |
| US6538917B1 | Read methods for magneto-resistive device having soft reference layer | Physics | 29 | Expired |
| US6538920B2 | Cladded read conductor for a pinned-on-the-fly soft reference layer | Electricity | 27 | Expired |
| US6504221B1 | Magneto-resistive device including soft reference layer having embedded conductors | Electricity | 26 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.