Patent · US Active

Re-programmable self-test

US10247780B2 · kind B2 · utility

0Cited by
2References
19Claims
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Inventors

Key dates

Filing dateAug 2, 2017
Grant dateApr 2, 2019
Priority date
Expiry dateAug 2, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2029/3602
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The PRPG provides the test stimulus to the circuit, but it can only generate a finite number of care-bits from any given input seed which limits the maximum coverage that can be achieved. The only way to increase the coverage is to provide additional seed input data to the PRPG. The on-chip one time only programmable eFuse is used to store new PRPG seed data inputs and corresponding MISR output signature data for comparison. An XOR circuit option on the output of the MISR is operable to further compress the output data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.