Neil John Simpson
4Patents
1h-index
5Co-inventors
37Inventor score
Filing activity: Sep 22, 2003 → Jul 9, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7120842B2 | Mechanism to enhance observability of integrated circuit failures during burn-in tests | Physics | 2 | Expired |
| US11768240B2 | Re-programmable self-test | Physics | 0 | Active |
| US11092650B2 | Re-programmable self-test | Physics | 0 | Active |
| US10247780B2 | Re-programmable self-test | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.