Method and system for determining temperature using a magnetic junction

US10276226B2 · kind B2 · utility

Assignee

• SAMSUNG ELECTRONICS CO., LTD. · KR

Inventors

• Sebastian Schafer · Blomberg, DE
• Dmytro Apalkov · San Jose, US
• Alexey Vasilyevitch Khvalkovskiy · Milpitas, US
• Vladimir Nikitin · Campbell, US
• Robert Beach · Los Gatos, US
• Zheng Duan · Hanover, US

Key dates

• Filing date: Jun 11, 2018
• Grant date: Apr 30, 2019
• Expiry date: Jun 11, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G11C2029/5002
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

A method for measuring a temperature of magnetic junction switchable using spin transfer. The magnetic junction includes at least one magnetic layer. The method includes measuring a temperature variation of at least one magnetic characteristic for the magnetic layer(s) versus temperature. The method also includes measuring a bias variation in the magnetic characteristic versus an electrical bias for the magnetic junction. This measurement is performed such that spin transfer torque-induced variation(s) in the magnetic characteristic(s) are accounted for. The temperature versus the electrical bias for the magnetic junction is determined based on the temperature variation and the bias variation.