Patent · US Active

High-resolution scanning microscopy

US10281701B2 · kind B2 · utility

2Cited by

5References

27Claims

0Family size

Assignee

Carl Zeiss Microscopy GmbH · DE

Inventors

Ingo Kleppe · Jena, DE
Yauheni Novikau · Jena, DE
Ralf Netz · Jena, DE
Michael Gölles · Jena, DE
Gunther Lorenz · Übach-Palenberg, DE
Christoph Nieten · Jena, DE

Key dates

Filing date	Aug 12, 2014
Grant date	May 7, 2019
Priority date	—
Expiry date	Jan 13, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG02B26/0833
WIPO fieldOptics
WIPO sectorInstruments

Abstract

Microscope and method for high resolution scanning microscopy of a sample, wherein

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.