Apparatus and method for a user configurable reliability control loop
US10289514B2 · kind B2 · utility
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22Claims
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Key dates
| Filing date | Jun 30, 2014 |
| Grant date | May 14, 2019 |
| Priority date | — |
| Expiry date | Aug 11, 2037 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02D10/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An apparatus and method for a user configurable reliability control loop. For example, one embodiment of a processor comprises: a reliability meter to track accumulated stress on components of the processor based on measured processor operating conditions; and a controller to receive stress rate limit information and to responsively specify a set of N operating limits on the processor in accordance with the accumulated stress and the stress rate limit information; and performance selection logic to output one or more actual operating conditions for the processor based on the N operating limits specified by the controller.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.