Integrated cooling system for electronics testing apparatus
US10297339B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 19, 2014 |
| Grant date | May 21, 2019 |
| Priority date | — |
| Expiry date | Nov 8, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K7/20236
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Example features or aspects of the present invention are described in relation to a small, quiet integrated cooling system for an apparatus for testing electronic devices. Characteristics of the test apparatus including a low noise output, low power consumption and a compact size with a small spatial and volume footprint are selected for deployment and use in a an office like environment. The test apparatus comprises a chassis frame and a cooler frame disposed within the chassis frame and thus integrated within the test apparatus, which has a reduced form factor suitable for the in-office deployment. Embodiments offer the ability to maintain the working fluid at a constant temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.