Patent · US Active

Testing fuse configurations in semiconductor devices

US10302696B2 · kind B2 · utility

0Cited by
149References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 30, 2016
Grant dateMay 28, 2019
Priority date—
Expiry dateMay 31, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2224/48145
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Methods, systems, and apparatus for testing semiconductor devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.