Paul Fuller
17Patents
6h-index
14Co-inventors
63Inventor score
Filing activity: Oct 7, 1996 → Feb 24, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6889357B1 | Timing calibration pattern for SLDRAM | Electricity | 58 | Expired |
| US5966388A | High-speed test system for a memory device | Physics | 48 | Expired |
| US6154860A | High-speed test system for a memory device | Physics | 42 | Expired |
| US6550026B1 | High speed test system for a memory device | Physics | 30 | Expired |
| US6055611A | Method and apparatus for enabling redundant memory | Physics | 17 | Expired |
| US8063650B2 | Testing fuse configurations in semiconductor devices | Electricity | 7 | Active |
| US5783948A | Method and apparatus for enhanced booting and DC conditions | Electricity | 6 | Expired |
| US5945845A | Method and apparatus for enhanced booting and DC conditions | Electricity | 4 | Expired |
| US7305509B2 | Method and apparatus for zero stub serial termination capacitor of resistor mounting option in an information handling system | Emerging Cross-Sectional Technologies | 3 | Expired |
| US9568544B2 | Testing fuse configurations in semiconductor devices | Electricity | 2 | Active |
| US8717052B2 | Testing fuse configurations in semiconductor devices | Electricity | 1 | Active |
| US11962674B2 | MIPI translation in gigabit multimedia serial link | Electricity | 0 | Active |
| US11009548B2 | Testing fuse configurations in semiconductor devices | Electricity | 0 | Active |
| US7370253B2 | Apparatus and method for high-speed SAS link protocol testing | Electricity | 0 | Active |
| US11595504B2 | MIPI translation in GMSL tunnel mode | Electricity | 0 | Active |
| US10302696B2 | Testing fuse configurations in semiconductor devices | Electricity | 0 | Active |
| US7613965B2 | Apparatus and method for high-speed SAS link protocol testing | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.