Inventor · Pleasanton, CA, US

Adrian E. Ong

126Patents
26h-index
45Co-inventors
90Inventor score

Filing activity: Dec 17, 1992 → Sep 6, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US5901105A Dynamic random access memory having decoding circuitry for partial memory blocks Physics 129 Expired
US5311481A Wordline driver circuit having a directly gated pull-down device Physics 116 Expired
US5675549A Burst EDO memory device address counter Physics 116 Expired
US5528539A High speed global row redundancy system Physics 100 Expired
US5850368A Burst EDO memory address counter Physics 90 Expired
US5999480A Dynamic random-access memory having a hierarchical data path Physics 75 Expired
US6365421B2 Method and apparatus for storage of test results within an integrated circuit Physics 73 Expired
US6194738A Method and apparatus for storage of test results within an integrated circuit Physics 67 Expired
US8625339B2 Multi-cell per memory-bit circuit and method Physics 56 Active
US7061263B1 Layout and use of bond pads and probe pads for testing of integrated circuits devices Electricity 54 Expired
US8456926B2 Memory write error correction circuit Physics 52 Active
US5631862A Self current limiting antifuse circuit Physics 52 Expired
US6732304B1 Chip testing within a multi-chip semiconductor package Physics 49 Expired
US6104645A High speed global row redundancy system Physics 40 Expired
US5761145A Efficient method for obtaining usable parts from a partially good memory integrated circuit Physics 40 Expired
US7768847B2 Programmable memory repair scheme Physics 39 Active
US6812726B1 Entering test mode and accessing of a packaged semiconductor device Electricity 38 Expired
US5488583A Memory integrated circuits having on-chip topology logic driver, and methods for testing and producing such memory integrated circuits Physics 34 Expired
US10446256B2 Controller to detect malfunctioning address of memory device Physics 34 Active
US6882171B2 Bonding pads for testing of a semiconductor device Electricity 30 Expired
US5614859A Two stage voltage level translator Electricity 30 Expired
US5970008A Efficient method for obtaining usable parts from a partially good memory integrated circuit Physics 29 Expired
US7133798B1 Monitoring signals between two integrated circuit devices within a single package Electricity 28 Expired
US7444575B2 Architecture and method for testing of an integrated circuit device Physics 27 Expired
US7265570B2 Integrated circuit testing module Physics 27 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.