Vertical transport field-effect transistor including air-gap top spacer
US10319833B1 · kind B1 · utility
8Cited by
10References
13Claims
0Family size
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Key dates
| Filing date | Dec 4, 2017 |
| Grant date | Jun 11, 2019 |
| Priority date | — |
| Expiry date | Dec 4, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/679
Abstract
A vertical transport field-effect transistor includes a top source/drain region separated from an underlying gate stack by a top spacer including open gaps to reduce capacitance therebetween. Techniques for fabricating the transistor include using a sacrificial spacer that is selectively removed prior to growth of the top source/drain region. The top source/drain region may be confined by opposing dielectric layers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.