Christopher J. Waskiewicz
67Patents
8h-index
64Co-inventors
81Inventor score
Filing activity: Apr 30, 1996 → Jul 7, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9666528B1 | BEOL vertical fuse formed over air gap | Electricity | 403 | Active |
| US6294449A | Self-aligned contact for closely spaced transistors | Electricity | 26 | Expired |
| US10229986B1 | Vertical transport field-effect transistor including dual layer top spacer | Electricity | 22 | Active |
| US5712702A | Method and apparatus for determining chamber cleaning end point | Chemistry; Metallurgy | 18 | Expired |
| US9449871B1 | Hybrid airgap structure with oxide liner | Electricity | 12 | Active |
| US6703312B2 | Method of forming active devices of different gatelengths using lithographic printed gate images of same length | Electricity | 12 | Expired |
| US8986921B2 | Lithographic material stack including a metal-compound hard mask | Physics | 9 | Active |
| US9780027B2 | Hybrid airgap structure with oxide liner | Electricity | 8 | Active |
| US10319833B1 | Vertical transport field-effect transistor including air-gap top spacer | Electricity | 8 | Active |
| US10483361B1 | Wrap-around-contact structure for top source/drain in vertical FETs | Electricity | 7 | Active |
| US8987133B2 | Titanium oxynitride hard mask for lithographic patterning | Electricity | 6 | Active |
| US10361129B1 | Self-aligned double patterning formed fincut | Electricity | 6 | Active |
| US11171051B1 | Contacts and liners having multi-segmented protective caps | Electricity | 4 | Active |
| US5753303A | Process for the elimination of tungsten oxidation with inert gas stabilization in chemical vapor deposition processes | Electricity | 4 | Expired |
| US10559671B2 | Vertical transport field-effect transistor including air-gap top spacer | Electricity | 4 | Active |
| US10770653B1 | Selective dielectric deposition to prevent gouging in MRAM | Electricity | 3 | Active |
| US9087876B2 | Titanium oxynitride hard mask for lithographic patterning | Electricity | 3 | Active |
| US11239165B2 | Method of forming an interconnect structure with enhanced corner connection | Electricity | 2 | Active |
| US6303275A | Method for resist filling and planarization of high aspect ratio features | Physics | 2 | Expired |
| US9978560B2 | System and method for performing nano beam diffraction analysis | Electricity | 2 | Active |
| US10475878B2 | BEOL capacitor through airgap metallization | Electricity | 1 | Active |
| US11244861B2 | Method and structure for forming fully-aligned via | Electricity | 1 | Active |
| US10741652B2 | Wrap-around-contact structure for top source/drain in vertical FETs | Electricity | 1 | Active |
| US6489255B1 | Low temperature/low dopant oxide glass film | Electricity | 1 | Expired |
| US11476346B2 | Vertical transistor having an oxygen-blocking top spacer | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.