Apparatuses and methods for calibrating adjustable impedances of a semiconductor device
US10348270B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 7, 2017 |
| Grant date | Jul 9, 2019 |
| Priority date | — |
| Expiry date | Dec 7, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03H11/54
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Apparatuses and methods for calibrating adjustable impedances of a semiconductor device are disclosed in the present application. An example apparatus includes a register configured to store impedance calibration information and further includes programmable termination resistances having a programmable impedance. The example apparatus further includes an impedance calibration circuit configured to perform a calibration operation to determine calibration parameters for setting the programmable impedance of the programmable termination resistances. The impedance calibration circuit is further configured to program the impedance calibration information in the register related to the calibration operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.