Logic layout with reduced area and method of making the same
US10373942B2 · kind B2 · utility
3Cited by
2References
10Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 1, 2017 |
| Grant date | Aug 6, 2019 |
| Priority date | — |
| Expiry date | Dec 1, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D86/215
Abstract
A method of forming a SRAM semiconductor device with reduced area layout and a resulting device are provided. Embodiments include forming a first field effect transistor (FET) over a substrate; forming an insulating material over the first FET; forming a second FET over the insulating material; and patterning the first FET, insulating material and second FET to form fins over the substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.