Patent · US Active

Process for performing self-limited etching of organic materials

US10381238B2 · kind B2 · utility

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1References
19Claims
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Assignee

Inventors

Key dates

Filing dateMar 1, 2018
Grant dateAug 13, 2019
Priority date
Expiry dateMar 1, 2038

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/3341
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus for selectively etching an organic material on a substrate is described. The method and apparatus includes forming a first plasma-excited process gas containing hydrogen (H) and optionally a noble gas element, exposing the substrate to the first plasma-excited process gas, forming a second plasma-excited process gas containing a noble gas element, exposing the substrate to the second plasma-excited process gas, and cyclically repeating the forming and exposing the first and second plasma-excited process gases at least two cycles to etch the first material selectively relative to the second material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.