Patent · US Active

Method of using a high resolution laser scanning microscope and high resolution laser scanning microscope

US10386621B2 · kind B2 · utility

1Cited by

2References

20Claims

0Family size

Assignee

ABBERIOR INSTRUMENTS GMBH · DE

Inventors

Benjamin Harke · Oettingen, DE
Matthias Reuss · Sundbyberg, SE
Lars Kastrup · Göttingen, DE

Key dates

Filing date	Jan 24, 2017
Grant date	Aug 20, 2019
Priority date	—
Expiry date	Jul 24, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG02B27/58
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A high resolution laser scanning microscope has beam shaping elements configured to shape a beam of fluorescence inhibiting light which is directed into a back aperture of an objective connected to form an intensity minimum delimited by intensity maxima of the fluorescence inhibiting light in a focus of the objective. A plurality of optical elements including the objective and the beam shaping elements are arranged in a beam path of the beam to the focus. Using the microscope includes removing or exchanging or altering or adding at least one of the optical elements arranged in the beam path of the beam of fluorescence inhibiting light, and compensating a variation of polarization varying properties of the plurality of the optical elements, that is caused by removing or exchanging or altering or adding the at least one optical element, by adapting the beam shaping elements to the variation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.