Benjamin Harke
9Patents
1h-index
9Co-inventors
36Inventor score
Filing activity: Aug 12, 2014 → Mar 25, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9772285B2 | Stimulated emission-depletion (STED) microscopy based on time gating of excitation beam and synchronous detection of fluorescence emission | Physics | 2 | Active |
| US9632297B1 | Device for separately modulating the wave fronts of two components of a light beam and microscope comprising the device | Physics | 1 | Active |
| US10386621B2 | Method of using a high resolution laser scanning microscope and high resolution laser scanning microscope | Physics | 1 | Active |
| US10429305B2 | Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers | Physics | 1 | Active |
| US11131630B2 | Method of aligning a laser-scanning fluorescence microscope and laser-scanning fluorescence microscope having an automatic aligning system | Physics | 1 | Active |
| US10488342B2 | Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers | Physics | 0 | Active |
| US12352943B2 | Method and device for illuminating a sample in a microscope in points | Physics | 0 | Active |
| US12259329B2 | Method of disturbance correction, and laser scanning microscope having disturbance correction | Physics | 0 | Active |
| US12055728B2 | Method and light microscope for a high-resolution examination of a sample | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.