Patent · US Active

Prediction of process-sensitive geometries with machine learning

US10402524B2 · kind B2 · utility

5Cited by
10References
14Claims
0Family size

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Key dates

Filing dateMay 8, 2017
Grant dateSep 3, 2019
Priority date
Expiry dateJun 6, 2037

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P90/02
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Methods according to the disclosure include: predicting process-sensitive geometries (PSGs) in a proposed IC layout based on violations of a set of processing constraints for the proposed IC layout, the set of processing constraints being calculated with a predictive model based on a training data repository having a plurality of optical rule check (ORC) simulations for different IC layouts; identifying actual PSGs in a circuit manufactured using the proposed IC layout; determining whether the predicted PSGs correspond to the actual PSGs in the manufactured circuit as being correct; in response to the predicting being incorrect: adjusting the predictive model based on the actual PSGs, wherein the adjusting includes submitting additional ORC data to the training data repository; and flagging the proposed IC layout as incorrectly predicted; and in response to the predicting being correct, flagging the proposed IC layout as correctly predicted.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.