Auto test grouping/clock sequencing for at-speed test

US10436837B2 · kind B2 · utility

Assignee

• GlobalFoundries Inc. · KY

Inventors

• Hardik Bhagat · Savanuru, IN
• Mark R. Taylor · South Burlington, US
• Baalaji Konda Ramamoorthy · Bengaluru, IN
• Douglas E. Sprague · Jericho, US
• Greeshma Jayakumar · Thrippunithura, IN

Key dates

• Filing date: Oct 19, 2015
• Grant date: Oct 8, 2019
• Expiry date: Jun 7, 2036

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31727
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method includes: defining a plurality of clock architecture attributes for a plurality of clock domains to be tested; assigning each one of the plurality of clock domains to a first test group; and refining the assignment of each one of the plurality of clock domains based on the plurality of clock architecture attributes until each of the plurality of clock domains is grouped into a current test group.