Apparatus and method for detecting surface topography
US10456029B2 · kind B2 · utility
2Cited by
1References
20Claims
0Family size
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Key dates
| Filing date | Nov 3, 2017 |
| Grant date | Oct 29, 2019 |
| Priority date | — |
| Expiry date | Apr 19, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30041
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and methods are described, for detecting the surface topography of a portion of a curved surface of an object. A beam of light is directed toward the surface from a broad angle of incidence with respect to an optical axis of a camera. Light reflected from the surface is received by the camera, via a narrow-angle aperture. One or more darkened regions in the received light are detected, and the surface topography of portion of the surface is detected at least partially in response to the detected darkened regions. Other applications are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.