Inventor · Jerusalem, IL

Yoel Arieli

41Patents
8h-index
31Co-inventors
75Inventor score

Filing activity: Oct 16, 2000 → Sep 13, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US8493496B2 Depth mapping using projected patterns Electricity 169 Active
US8150142B2 Depth mapping using projected patterns Physics 76 Active
US8494252B2 Depth mapping using optical elements having non-uniform focal characteristics Physics 61 Active
US8761495B2 Distance-varying illumination and imaging techniques for depth mapping Physics 50 Active
US6507441B1 Directed reflectors and systems utilizing same Physics 47 Expired
US7609388B2 Spatial wavefront analysis and 3D measurement Physics 17 Expired
US6707608B1 Diffractive optical element and a method for producing same Physics 14 Expired
US6819435B2 Spatial and spectral wavefront analysis and measurement Physics 8 Expired
US7327470B2 Spatial and spectral wavefront analysis and measurement Physics 6 Expired
US8620041B2 Method apparatus and system for analyzing thermal images Physics 6 Active
US9995948B2 Adhesive optical film to convert an eyeglass lens to a progressive lens Physics 5 Active
US10024650B2 System for analyzing optical properties of an object Physics 3 Active
US11546574B2 High resolution 3D display Electricity 3 Active
US9885459B2 Pattern projection using micro-lenses Electricity 3 Active
US9757027B2 System and method for performing tear film structure measurement and evaporation rate measurements Physics 3 Active
US9833139B1 System and method for performing tear film structure measurement Physics 2 Active
US9710900B2 Method apparatus and system for analyzing images Physics 2 Active
US9696134B2 System for performing dual path, two-dimensional optical coherence tomography (OCT) Physics 2 Active
US9198640B2 System and methods for providing information related to a tissue region of a subject Human Necessities 2 Active
US7542144B2 Spatial and spectral wavefront analysis and measurement Physics 2 Active
US10456029B2 Apparatus and method for detecting surface topography Physics 2 Active
US10712591B2 Adhesive optical film to convert an eyeglass lens to a progressive lens Physics 1 Active
US10024783B2 Interferometric ellipsometry and method using conical refraction Physics 1 Active
US10054419B2 Method for analyzing an object using a combination of long and short coherence interferometry Physics 1 Active
US12213733B2 System and method for detecting physical characteristics of a multilayered tissue of a subject Human Necessities 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.