Electronic circuit having serial latch scan chains

US10459031B2 · kind B2 · utility

Assignee

• GlobalFoundries Inc. · KY

Inventors

• Tilman Gloekler · Schrobenhausen, DE
• Andreas C. Koenig · Rockford, US
• Jens Kuenzer · Eppelheim, DE
• Cedric Lichtenau · Stuttgart, DE

Key dates

• Filing date: Oct 21, 2014
• Grant date: Oct 29, 2019
• Expiry date: Oct 2, 2035

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/318544
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates to an electronic circuit (10) having one or more latch scan chains (12), the electronic circuit (10) comprising (i) a built-in test structure (14); (ii) generation means (16) for simultaneously generating scan-in data for each of said scan chains (12); (iii) interception means (18) for simultaneously intercepting test lines (20) of said scan chains (12), said test lines (20) comprising scan-in lines (22) and/or control lines (24). Said interception means (18) are responsive to said generation means (16) in order to simultaneously feed the generated scan-in data into each of said scan chains (12) for initializing the electronic circuit (10). The invention further relates to a method for initializing an electronic circuit (10), as well as a data processing system (210) for initializing an electronic circuit (10).