Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers

US10488342B2 · kind B2 · utility

Assignee

• ABBERIOR INSTRUMENTS GMBH · DE

Inventors

• Andreas Schoenle · Oettingen, DE
• Christian Wurm · Oettingen, DE
• Benjamin Harke · Oettingen, DE
• Gerald Donnert · Oettingen, DE

Key dates

• Filing date: Oct 23, 2018
• Grant date: Nov 26, 2019
• Expiry date: Oct 23, 2038

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2201/067
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

In methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers, the sample is subjected to a light intensity distribution including an intensity maximum of focused fluorescence excitation light to selectively scan partial areas of interest of the sample. Fluorescence light emitted out of the sample is registered and allocated to a respective location of the light intensity distribution in the sample. The subjection of the sample to at least one part of the light intensity distribution is terminated at each location of the light intensity distribution, if at least one criterion of the following criteria is met: (a) a predetermined maximum light amount of the fluorescence light emitted out of the sample has been registered, and (b) a predetermined minimum light amount of the fluorescence light emitted out of the sample has not been registered within a predetermined period of time.