Patent · US Active

Dual gate memory devices

US10497415B2 · kind B2 · utility

1Cited by
16References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 8, 2018
Grant dateDec 3, 2019
Priority date
Expiry dateJan 8, 2038

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B61/22
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The various implementations described herein include methods, devices, and systems for performing operations on memory devices. In one aspect, a memory device includes: (1) a first charge storage device having a first gate with a corresponding first threshold voltage, the first charge storage device configured to store charge corresponding to one or more first bits; and (2) a second charge storage device having a second gate with a corresponding second threshold voltage, distinct from the first threshold voltage, the second charge storage device configured to store charge corresponding to one or more second bits; where the second charge storage device is coupled in parallel with the first charge storage device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.