Damaging components with defective electrical couplings
US10529632B2 · kind B2 · utility
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10References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 11, 2018 |
| Grant date | Jan 7, 2020 |
| Priority date | — |
| Expiry date | Sep 11, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/1304
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method, in some embodiments, comprises: providing a component having first and second electrical nodes; determining that the component lacks multiple, functional electrical couplings between said first and second nodes; damaging at least part of the component as a result of said determination; and determining, as a result of said damage, that the component is defective.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.