Vertical transport field-effect transistor including air-gap top spacer
US10559671B2 · kind B2 · utility
4Cited by
10References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 6, 2019 |
| Grant date | Feb 11, 2020 |
| Priority date | — |
| Expiry date | May 6, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/679
Abstract
A vertical transport field-effect transistor includes a top source/drain region separated from an underlying gate stack by a top spacer including open gaps to reduce capacitance therebetween. Techniques for fabricating the transistor include using a sacrificial spacer that is selectively removed prior to growth of the top source/drain region. The top source/drain region may be confined by opposing dielectric layers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.