Patent · US Active

Resistive random access memory with deuterium

US10573809B2 · kind B2 · utility

1Cited by
0References
25Claims
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Assignee

Inventors

Key dates

Filing dateMar 31, 2016
Grant dateFeb 25, 2020
Priority date
Expiry dateMar 31, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N70/8836

Abstract

An embodiment includes a memory comprising: a top electrode and a bottom electrode; an oxygen exchange layer (OEL) between the top and bottom electrodes; and an oxide layer between the OEL and the bottom electrode; wherein the oxide layer includes Deuterium and oxygen vacancies. Other embodiments are described herein.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.