Resistive random access memory with deuterium
US10573809B2 · kind B2 · utility
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25Claims
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Key dates
| Filing date | Mar 31, 2016 |
| Grant date | Feb 25, 2020 |
| Priority date | — |
| Expiry date | Mar 31, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10N70/8836
Abstract
An embodiment includes a memory comprising: a top electrode and a bottom electrode; an oxygen exchange layer (OEL) between the top and bottom electrodes; and an oxide layer between the OEL and the bottom electrode; wherein the oxide layer includes Deuterium and oxygen vacancies. Other embodiments are described herein.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.