Inventor · San Jose, CA, US

Prashant Majhi

120Patents
11h-index
96Co-inventors
79Inventor score

Filing activity: Apr 14, 2004 → Apr 14, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US7361538B2 Transistors and methods of manufacture thereof Electricity 66 Expired
US8384122B1 Tunneling transistor suitable for low voltage operation Electricity 49 Active
US10651153B2 Three-dimensional (3D) memory with shared control circuitry using wafer-to-wafer bonding Electricity 44 Active
US7759142B1 Quantum well MOSFET channels having uni-axial strain caused by metal source/drains, and conformal regrowth source/drains Electricity 25 Active
US7435987B1 Forming a type I heterostructure in a group IV semiconductor Electricity 24 Active
US7947971B2 Quantum well MOSFET channels having uni-axial strain caused by metal source/drains, and conformal regrowth source/drains Electricity 20 Active
US7332433B2 Methods of modulating the work functions of film layers Electricity 17 Expired
US7928426B2 Forming a non-planar transistor having a quantum well channel Electricity 16 Active
US7629603B2 Strain-inducing semiconductor regions Electricity 16 Active
US8936976B2 Conductivity improvements for III-V semiconductor devices Electricity 13 Active
US8258498B2 Quantum well MOSFET channels having uni-axial strain caused by metal source/drains, and conformal regrowth source/drains Electricity 12 Active
US9559215B1 Method and apparatus for making p-channel thin film transistors for OLED and LED active matrix flat panel displays Electricity 11 Active
US8237153B2 Forming a non-planar transistor having a quantum well channel Electricity 9 Active
US10868246B2 Conductive bridge random access memory (CBRAM) devices with low thermal conductivity electrolyte sublayer Physics 9 Active
US7777282B2 Self-aligned tunneling pocket in field-effect transistors and processes to form same Electricity 8 Active
US9653680B2 Techniques for filament localization, edge effect reduction, and forming/switching voltage reduction in RRAM devices Electricity 8 Active
US10439134B2 Techniques for forming non-planar resistive memory cells Electricity 7 Active
US7696517B2 NMOS transistors that mitigate fermi-level pinning by employing a hafnium-silicon gate electrode and high-k gate dieletric Electricity 6 Active
US11075207B2 SRAM using 2T-2S Electricity 5 Active
US10084058B2 Quantum well MOSFET channels having lattice mismatch with metal source/drains, and conformal regrowth source/drains Electricity 5 Active
US10090461B2 Oxide-based three-terminal resistive switching logic devices Electricity 5 Active
US8501508B2 Method of forming quantum well mosfet channels having uni-axial strains caused by metal source/drains Electricity 5 Active
US10355205B2 Resistive memory cells including localized filamentary channels, devices including the same, and methods of making the same Electricity 4 Active
US7545003B2 Defect-free source/drain extensions for MOSFETS having germanium based channel regions Electricity 4 Active
US8236686B2 Dual metal gates using one metal to alter work function of another metal Electricity 4 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.