Method for testing MRAM device and test apparatus thereof
US10665321B2 · kind B2 · utility
4Cited by
1References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Aug 30, 2017 |
| Grant date | May 26, 2020 |
| Priority date | — |
| Expiry date | Aug 30, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5002
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The disclosure is related a method for testing a magnetic memory device and a test apparatus are provided. In some exemplary embodiments, the method includes at least the following steps. The magnetic memory device is initialized by applying a first magnetic field to force write a first data to the magnetic memory device. Then, a second magnetic field is applied to the magnetic memory device. Second data may be obtained from the magnetic memory device by performing a chip probing process. Accordingly, performance of the magnetic memory device may be determined based on the second data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.