Chia Yu Wang
16Patents
3h-index
29Co-inventors
60Inventor score
Filing activity: Aug 27, 2001 → Jul 31, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7125388B1 | Robotic gait rehabilitation by optimal motion of the hip | Human Necessities | 61 | Expired |
| US6720791B2 | LCD testing method | Physics | 6 | Expired |
| US10665321B2 | Method for testing MRAM device and test apparatus thereof | Physics | 4 | Active |
| US10877089B2 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | Physics | 1 | Active |
| US11726747B2 | Magnetoresistive random-access memory (MRAM) random number generator (RNG) and a related method for generating a random bit | Physics | 0 | Active |
| US11531524B2 | Magnetoresistive random-access memory (MRAM) random number generator (RNG) and a related method for generating a random bit | Physics | 0 | Active |
| US11081304B2 | Load control system and control method thereof | Physics | 0 | Active |
| US11291318B2 | Quilt structure with non-powered energy layer and far-infrared fibers to make the same | Performing Operations; Transporting | 0 | Active |
| US12210055B2 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | Physics | 0 | Active |
| US8085255B2 | Method for zooming image | Physics | 0 | Active |
| US11726062B2 | Magnetic layer characterization system and method | Electricity | 0 | Active |
| US11249131B2 | Test apparatus and testing method using the same | Electricity | 0 | Active |
| US11506706B2 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | Physics | 0 | Active |
| US11837312B1 | Magnetic memory device | Physics | 0 | Active |
| US12040036B2 | Magnetic memory device | Physics | 0 | Active |
| US11719742B2 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.