Meng-Chun Shih
22Patents
1h-index
17Co-inventors
46Inventor score
Filing activity: Feb 5, 2016 → Jul 31, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10665321B2 | Method for testing MRAM device and test apparatus thereof | Physics | 4 | Active |
| US10228998B2 | Systems and methods for correcting data errors in memory susceptible to data loss when subjected to elevated temperatures | Physics | 1 | Active |
| US10877089B2 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | Physics | 1 | Active |
| US10936413B2 | Systems and methods for correcting data errors in memory | Physics | 1 | Active |
| US10128313B2 | Non-volatile memory device and structure thereof | Electricity | 1 | Active |
| US11429482B2 | Systems and methods for correcting data errors in memory | Physics | 1 | Active |
| US11276649B2 | Devices and methods having magnetic shielding layer | Electricity | 0 | Active |
| US11726062B2 | Magnetic layer characterization system and method | Electricity | 0 | Active |
| US11726747B2 | Magnetoresistive random-access memory (MRAM) random number generator (RNG) and a related method for generating a random bit | Physics | 0 | Active |
| US11249131B2 | Test apparatus and testing method using the same | Electricity | 0 | Active |
| US12040036B2 | Magnetic memory device | Physics | 0 | Active |
| US11531524B2 | Magnetoresistive random-access memory (MRAM) random number generator (RNG) and a related method for generating a random bit | Physics | 0 | Active |
| US12191262B2 | Package structure and method for fabricating the same | Electricity | 0 | Active |
| US12210055B2 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | Physics | 0 | Active |
| US11755410B2 | Systems and methods for correcting data errors in memory | Physics | 0 | Active |
| US11506706B2 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | Physics | 0 | Active |
| US10176998B2 | Semiconductor device | Electricity | 0 | Active |
| US11380626B2 | Package structure and method for fabricating the same | Electricity | 0 | Active |
| US11719742B2 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | Physics | 0 | Active |
| US11749617B2 | Package structure and method for fabricating the same | Electricity | 0 | Active |
| US10818609B2 | Package structure and method for fabricating the same | Electricity | 0 | Active |
| US11837312B1 | Magnetic memory device | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.