Patent · US Active

Editing of layout designs for fixing DRC violations

US10671793B1 · kind B1 · utility

2Cited by
26References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 31, 2018
Grant dateJun 2, 2020
Priority date
Expiry dateJul 31, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/392
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present embodiments relate to providing an overlap view of external and internal components of all instance circuit cells related to a master circuit cell in a same layout view. A layout of a circuit having a plurality of instance circuit cells of a master circuit cell is provided. Further, a graphical user interface including a user selectable option for an overlay view is provided. In addition, responsive to the selection of the overlay view, the plurality of instance circuit cells of the master circuit cell is determined. In addition, a plurality of sets of circuit elements, each set of circuit elements including external circuit elements that overlap with a corresponding instance circuit cell of the plurality of instance circuit cells is determined. Further, the plurality of sets of circuit elements overlaid on the master circuit cell is displayed on the layout view.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.