Patent · US Active

Gap detection for consecutive write operations of a memory device

US10672441B2 · kind B2 · utility

1Cited by

17References

20Claims

0Family size

Assignee

Micron Technology, Inc. · US

Inventors

Daniel B. Penney · Wylie, US
Liang Chen · Allen, US
David R. Brown · Lucas, US

Key dates

Filing date	Jul 31, 2018
Grant date	Jun 2, 2020
Priority date	—
Expiry date	Jul 31, 2038

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY02D10/00
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Method and devices include a shifter that is configured to receive a write command for a memory device and is configured to produce multiple shifted write commands from the write command. Multiple flip-flops that are configured to receive a subset of the multiple shifted write commands from the shifter. The multiple flip-flops also are configured to output an indicator of whether subsequent write commands of the subset of write commands is asserted when the write command has completed shifting through the shifter as a write start signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.