DUT testing with configurable cooling control using DUT internal temperature data
US10677842B2 · kind B2 · utility
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21References
19Claims
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Key dates
| Filing date | May 26, 2017 |
| Grant date | Jun 9, 2020 |
| Priority date | — |
| Expiry date | May 30, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/56
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
New cooling control techniques suitable for use in the testing of devices are disclosed. The new cooling control techniques are an improvement over existing cooling control techniques because the new cooling control techniques utilize inputs that are more representative of actual thermal conditions experienced by a DUT (device under test) and/or are more representative of various other parameters, such as DUT power consumption/dissipation, during testing. Also, the new cooling control techniques offer flexibility with respect to the cooling control algorithm to employ for the DUT during testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.