Leon Chen
12Patents
5h-index
18Co-inventors
63Inventor score
Filing activity: Aug 15, 1997 → Nov 13, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5883906A | Pattern data compression and decompression for semiconductor test system | Physics | 38 | Expired |
| US8082541B2 | Method and system for performing installation and configuration management of tester instrument modules | Physics | 15 | Active |
| US7210087B2 | Method and system for simulating a modular test system | Physics | 15 | Expired |
| US8255198B2 | Method and structure to develop a test program for semiconductor integrated circuits | Physics | 9 | Active |
| US7437261B2 | Method and apparatus for testing integrated circuits | Physics | 8 | Expired |
| US10557886B2 | Test system supporting multiple users using different applications | Physics | 5 | Active |
| US9785542B2 | Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing | Physics | 2 | Active |
| US10451668B2 | Test program flow control | Physics | 1 | Active |
| US9274911B2 | Using shared pins in a concurrent test execution environment | Physics | 0 | Active |
| US9785526B2 | Automated generation of a test class pre-header from an interactive graphical user interface | Physics | 0 | Active |
| US11156659B2 | Optimization and scheduling of the handling of devices in the automation process | Physics | 0 | Active |
| US10677842B2 | DUT testing with configurable cooling control using DUT internal temperature data | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.