Checking wafer-level integrated designs for rule compliance
US10691870B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 1, 2019 |
| Grant date | Jun 23, 2020 |
| Priority date | — |
| Expiry date | May 28, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/392
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and systems for checking a wafer-level design for compliance with a rule include determining a tile area, having a size that is based on the one or more layout design rules, that crosses a boundary between adjacent chip layouts and that leaves at least a portion of each chip layout uncovered. It is determined that a portion of a first chip layout inside the tile area fails to comply with one or more layout design rules. The first chip layout is modified, responsive to the determination that the first chip layout within the tile area fails to comply with the one or more layout design rules, to bring non-compliant periphery chip regions into compliance. It is determined that the portion of the first chip layout within the tile area complies with the one or more design rules after modifying the first chip layout. A multi-chip wafer is fabricated that includes the chip layouts.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.