Patent · US Active

Polishing apparatus

US10702972B2 · kind B2 · utility

4Cited by
19References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 3, 2014
Grant dateJul 7, 2020
Priority date
Expiry dateApr 13, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/304
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A polishing apparatus capable of precisely controlling a polishing profile, particularly a polishing profile in an edge portion, of a wafer is disclosed. The polishing apparatus includes: a top ring shaft; a housing fixed to the top ring shaft; a flexible membrane configured to press a wafer against a polishing pad; a top ring body configured to hold the flexible membrane; a retaining ring coupled to the top ring body and disposed so as to surround the flexible membrane; a gimbal mechanism configured to allow the top ring body and the retaining ring to tilt with respect to the housing; and a local load exerting mechanism configured to exert a downward local load on a part of the retaining ring.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.