Patent · US Active

Master alloy for sputtering target and method for producing sputtering target

US10704137B2 · kind B2 · utility

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6References
5Claims
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Key dates

Filing dateSep 28, 2015
Grant dateJul 7, 2020
Priority date
Expiry dateDec 21, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/3426
  • WIPO fieldMaterials, metallurgy
  • WIPO sectorChemistry

Abstract

Provided is a master alloy for a sputtering target, wherein, when elements constituting the master alloy are following X1, X2, Y1, Y2, Y2, and Y3; specifically, where X1 is one or two types of Ta or W; X2 is at least one type of Ru, Mo, Nb or Hf; Y1 is one or two types of Cr or Mn; Y2 is one or two types of Co or Ni; and Y3 is one or two types of Ti or V, the master alloy comprises any one combination of X1-Y1, X1-Y2, X1-Y3, X2-Y1, and X2-Y2 of the foregoing constituent elements. The present invention consequently yields superior effects of being able to obtain a sintered sputtering target with few defects and having a high-density and uniform alloy composition, and, by using this target, to realize the deposition of an alloy barrier film with uniform quality and few particles at a high speed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.